| 000 | 00444nam a2200109Ia 4500 | ||
|---|---|---|---|
| 008 | 230718s9999 xx 000 0 und d | ||
| 100 | _aJoris De Hoog et al. | ||
| 245 | 0 | _aCombining an Electrothermal and Impedance Aging Model to Investigate Thermal Degradation Caused by Fast Charging | |
| 650 | _aComputer science, information & general works | ||
| 856 | _uhttps://new.zodml.org/sites/default/files/2023-07/combin1%20%282%29.pdf | ||
| 942 | _cEBK | ||
| 999 |
_c19671 _d19671 |
||