TY  - BOOK
AU  - Joris De Hoog et al.
TI  - Combining an Electrothermal and Impedance Aging Model to Investigate Thermal Degradation Caused by Fast Charging
KW  - Computer science, information & general works
UR  - https://new.zodml.org/sites/default/files/2023-07/combin1%20%282%29.pdf
ER  -